Advances in Imaging and Electron Physics 172

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Advances in Imaging and Electron Physics 172

Name: Advances in Imaging and Electron Physics 172
ISBN: 9780123944221

Jay Theodore Cremer (Eds.)

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This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

Key features:

* Contributions from leading authorities * Informs and updates on all the latest developments in the field

వర్గాలు:

Engineering

సంవత్సరం:

2012

ముద్రణం:

ప్రచురణకర్త:

Academic Press

భాష:

english

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